Spectral EM frequency metallic thickness measurement using metallic transparencies
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United States of America Patent
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May 21, 2002
Issued Date -
N/A
app pub date -
Nov 20, 2000
filing date -
Jun 11, 1998
priority date (Note) -
Expired
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Abstract
A method is provided for creating a spectral EM frequency to calculate the thickness of a material with unknown permeability and conductivity using metallic transparencies. The method comprises the steps of testing empirically to approximate the conductivity, testing empirically to approximate the permeability, creating a first set of electromagnetic waves adjacent to the material to be measured of a relatively low frequency, impinging the first set of electromagnetic waves on the material for saturating the material, creating a second set of electromagnetic waves having specific constant amplitude of a higher frequency than the first set of electromagnetic waves, the second set of electromagnetic waves for engaging the material and generating a sensing signal having modified characteristics, and receiving the sensing signal through the saturated material such that the modified characteristics of the sensing signal are processed to determine the thickness of the material.
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