Power supply slew time testing of electronic circuits
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United States of America Patent
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May 28, 2002
Grant Date -
N/A
app pub date -
Jun 30, 1998
filing date -
Jun 30, 1998
priority date (Note) -
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status (Latency Note)
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Abstract
Power supply slew time testing is performed on units that require a power supply for operation. A power supply voltage is applied to a unit under test. The power supply voltage has a test slew time that is selected to evaluate operation of the unit under test in a system. A response of the unit under test to the power supply having the test slew time is observed, and the condition of the unit under test is determined based on the response to the power supply having the test slew time. The test may involve application of the power supply voltage having a maximum test slew time and application of the power supply voltage having a minimum test slew time. The test slew times are selected based on the expected range of power supply slew times when the unit is installed in a system.
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