Material segregation and density analyzing apparatus and method
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United States of America Patent
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-
Jun 4, 2002
Grant Date -
N/A
app pub date -
May 23, 2001
filing date -
May 23, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A material analyzing apparatus comprises an analyzer body that contains a generally insulative material casing; a material analyzing circuitry that includes a transmitter, a receiver, and a control; an antenna system that includes a transmitting antenna, a receiving antenna, and a ground layer; a coupling structure that couples the antenna system to the material analyzing circuitry. The transmitter of the material analyzing circuitry generates a VHF electromagnetic wave signal that is adapted to be sent by the transmitting antenna and directed into the material to be analyzed. The receiving antenna receiving any returned signal from the material and sent to the receiver and to the control. The control then able to analyze the signal for material characteristics. The material characteristics including at least one of density and material segregation. The invention further includes a method for analyzing, as embodied by the invention.
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