Method and device for the inspection of a material by thermal imaging
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United States of America Patent
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Jul 16, 2002
Grant Date -
N/A
app pub date -
Jan 31, 2000
filing date -
Mar 5, 1997
priority date (Note) -
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Abstract
A heating zone (22) and a detection zone (23) at the surface (1a) of a part (1) are displaced in such a way as to carry out the scanning of the surface (1a) and a flux radiated in the detection zone (23) is detected by using a line of detectors (21) which is chosen from a matrix of detectors (20). The method makes is possible in particular to reduce the time for scanning the surface (1a) of the part and to be able to adjust the offset, in the direction of displacement (24), between the heating zone (22) and the detection (23), simply by choosing the line (21) of the matrix of detectors (20). The method and the device in accordance with the invention make it possible in particular to carry out thermographic inspections of parts made of any materials and in particular of metal parts which may have considerable dimensions and complex shapes.
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