Specimen preview and inspection system
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United States of America Patent
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Aug 6, 2002
Issued Date -
N/A
app pub date -
Mar 4, 1998
filing date -
Sep 15, 1995
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A specimen preview and inspection system is disclosed. The system beneficially includes a preview stage, which provides a set of biasing-information for preview by a technician before the technician formally screens the specimen. The preview stage enables the technician to conveniently review information pertinent to the specimen at issue. The preview stage may thereby bias, or channel, the technician's attention during screening toward diagnostically significant aspects of the specimen. The invention is particularly useful in the context of Pap smear screening, although the invention may extend to inspection of other types of specimens or samples as well.
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Family
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