Method for extracting inductance parameters from a circuit design

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United States of America Patent

PATENT NO 6434724
SERIAL NO

09531093

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of operating a data processing system to estimate the inductance values associated with a first metal trace having a defined width, thickness, and length in an integrated circuit. In the present invention, the number and location of any ground planes that are adjacent to the first trace in the integrated circuit are first determined. A first current loop passing through the first trace that depends on the number and location of the ground planes, if any, is defined. The magnetic flux per unit area generated in the first current loop when a predetermined current passes through the first trace is then determined and used to estimate the self-inductance of the first trace. If the first trace is adjacent to any ground planes, current loops through the first trace and the ground planes are also defined. The mutual inductance of the first trace and a second trace parallel thereto is determined by defining a current loop that passes through the first and second traces and determining the magnetic flux per unit area generated in the current loop when a predetermined current flows through the first trace. If the first trace and the second trace are adjacent to ground planes, additional current loops passing through each ground plane and one of the first and second traces are also defined. The invention reduces the computational workload inherent in extracting inductance by substituting N two-trace problems for the general problem involving N parallel traces.

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Patent Owner(s)

  • HEWLETT-PACKARD COMPANY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Norman H Fremont, CA 5 291
Lin, Shen Foster City, CA 15 151
Nakagawa, O Samual Redwood City, CA 1 18

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