Method for conducting sensor array-based rapid materials characterization
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United States of America Patent
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Aug 20, 2002
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N/A
app pub date -
Dec 11, 1998
filing date -
Dec 11, 1998
priority date (Note) -
Expired
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Abstract
A method for characterizing one or more material properties for each of five (5) or more samples, comprising the steps of depositing five or more samples on a substrate having 5 or more sensors arranged in a sensor array, wherein each sensor supports at least one sample of five or more samples and characterizes at least one material property of the sample supported thereby and measures at least one material property of the five or more samples at a rate of at least one sample every 2 minutes.
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