US Patent No: 6,439,970

Number of patents in Portfolio can not be more than 2000

Method and apparatus for releasably attaching polishing pads to planarizing machines in mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies

Stats

ATTORNEY / AGENT: (SPONSORED)
 

Importance

Loading Importance Indicators... loading....

Abstract

A method and an apparatus for releasably attaching a polishing pad to a support surface under the polishing pad. In one embodiment of the invention, a polishing pad has a first surface for planarizing a substrate assembly, a second surface contacting the support surface, and an interlocking element. The support surface has a retaining member configured to engage the interlocking element on the polishing pad. The interlocking element and retaining member can be any one of several configurations, including: tongue and groove, protuberance and depression, reciprocal elongated ridges, or teeth.

Loading the Abstract Image... loading....

First Claim

Related Publications

Loading Related Publications... loading....

Patent Owner(s)

Patent OwnerAddressTotal Patents
MICRON TECHNOLOGY, INC.BOISE, ID18599

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Walker, Michael A Kuna, ID 105 3063

Cited Art

Patent Info (Count) # Cites Year
 
MINNESOTA MINING AND MANUFACTURING COMPANY (5)
4,609,581 Coated abrasive sheet material with loop attachment means 119 1985
4,875,259 Intermeshable article 98 1988
5,201,785 Disc-holder assembly 34 1992
5,201,101 Method of attaching articles and a pair of articles fastened by the method 80 1992
5,958,794 Method of modifying an exposed surface of a semiconductor wafer 253 1996
 
3M INNOVATIVE PROPERTIES COMPANY (2)
5,672,186 Method of making an abrasive article 49 1996
5,876,268 Method and article for the production of optical quality surfaces on glass 16 1997
 
APPLIED MATERIALS, INC. (2)
5,722,877 Technique for improving within-wafer non-uniformity of material removal for performing CMP 107 1996
6,261,168 Chemical mechanical planarization or polishing pad with sections having varied groove patterns 51 1999
 
EXCLUSIVE DESIGN COMPANY, INC. (1)
6,007,407 Abrasive construction for semiconductor wafer modification 49 1997
 
JOHNSON ABRASIVE COMPANY, INC. (1)
6,099,603 System and method of attaching abrasive articles to backing pads 9 1998
 
MICRON TECHNOLOGY, INC. (1)
6,296,557 Method and apparatus for releasably attaching polishing pads to planarizing machines in mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies 99 1999
 
ROUND ROCK RESEARCH, LLC (1)
6,036,586 Apparatus and method for reducing removal forces for CMP pads 69 1998
 
SAMSUNG ELECTRONICS CO., LTD. (1)
5,735,731 Wafer polishing device 24 1996
 
OTHER [CHECK PATENT PROFILE FOR ASSIGNMENT INFORMATION] (3)
4,263,755 Abrasive product 65 1979
4,617,767 Sanding, buffing and polishing tool and parts thereof 40 1985
5,097,570 Fastening system 32 1991

Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
RAYTECH INNOVATIVE SOLUTIONS, INC. (1)
6,964,601 Method for securing a polishing pad to a platen for use in chemical-mechanical polishing of wafers 0 2003

Maintenance Fees

Fee Large entity fee small entity fee micro entity fee due date
11.5 Year Payment $7400.00 $3700.00 $1850.00 Feb 27, 2014
Fee Large entity fee small entity fee micro entity fee
Surcharge - 11.5 year - Late payment within 6 months $160.00 $80.00 $40.00
Surcharge after expiration - Late payment is unavoidable $700.00 $350.00 $175.00
Surcharge after expiration - Late payment is unintentional $1,640.00 $820.00 $410.00