Spring probe contactor for testing PGA devices
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United States of America Patent
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Aug 27, 2002
Grant Date -
N/A
app pub date -
Apr 9, 2001
filing date -
Apr 9, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A spring probe (pogo pin) contactor for testing semiconductor devices with pogo pins within a spring probe contactor is disclosed. The contactor device has a plurality of pogo pins extending therefrom for testing the semiconductor device. A surface of the spring pogo pin contactor has an array of apertures for receiving each pogo pin for contacting of the plurality of contacts on the device under test in order to make contact with and compress the pogo pins. A three piece assembly is used to accurately position the pogo pins for ease of construction and repair.
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