Probe contactor and production method thereof
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 17, 2002
Issued Date -
N/A
app pub date -
Dec 18, 2000
filing date -
Jun 19, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A probe contactor is formed on a planar surface of a substrate by a photolithography technology. The probe contactor is configured by a substrate having an interconnect trace thereon which is an electric conductive path, and a contactor formed on the substrate through a photolithography process. The contactor has a base portion vertically formed on the substrate, a horizontal portion, one end of which is formed on the base portion, and a contact portion formed on another end of the horizontal portion. A spring force of the horizontal portion of the contactor provides a contact force when the probe contactor is pressed against a contact target. The contact portion of the contactor is sharpened so that when the contactor is pressed against the contact target, it scrubs a surface of the contact target.
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