Test apparatus of integrated circuit
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United States of America Patent
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Oct 1, 2002
Grant Date -
N/A
app pub date -
Nov 28, 2000
filing date -
Nov 29, 1999
priority date (Note) -
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status (Latency Note)
Importance
Abstract
There are provided plural integrated circuits a to i in which a self-diagnostic result obtained from a self-diagnostic circuit 12 is outputted and controlled by select signals 1, 2, 3 supplied from the outside, and each the self-diagnostic result of the plural integrated circuits is respectively supplied to one monitor through a determination signal line every plural self-diagnostic results and control is performed by control signals 1, 2, 3 so that any one of the self-diagnostic results of the plural integrated circuits supplied to the one monitor is outputted.
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