Multiple parameter testing with improved sensitivity
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Oct 1, 2002
Grant Date -
N/A
app pub date -
Sep 29, 2000
filing date -
Sep 29, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and device are provided for testing electronic devices on a chip. This may be accomplished by measuring current through a first electronic device and measuring a speed of the first electronic device. A determination may then be made whether the first electronic device is defective by comparing the measured current and the measured speed with a multi-parameter (i.e., IDDQ and FMAX) threshold level.
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