On-chip transformers

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6459352
APP PUB NO 20020105406A1
SERIAL NO

09779402

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In an exemplary embodiment of the disclosed transformer, the transformer comprises a dielectric area. For example, the dielectric area can consist of three different dielectric layers. Also, by way of example, the dielectric area can comprise silicon dioxide or a low-k dielectric. According to the exemplary embodiment, the dielectric area is interspersed with a permeability conversion material. The permeability conversion material has a permeability higher than the permeability of the dielectric area. For example, the permeability conversion material can be nickel, iron, nickel-iron alloy, or magnetic oxide. The exemplary embodiment further comprises a first conductor and also a second conductor patterned into the dielectric area. The first and/or the second conductor can comprise copper, aluminum, or a copper-aluminum alloy. Each of the first and second conductors are made up of a number of turns which result in, respectively, the primary and secondary windings of the exemplary disclosed transformer.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
SKYWORKS SOLUTIONS, INC.NEWPORT BEACH, CA1144

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Howard, David Irvine, CA 60 654
Liu, Q Z Irvine, CA 9 85

Cited Art Landscape

Patent Info (Count) # Cites Year
 
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (1)
* 6309944 Overlay matching method which eliminates alignment induced errors and optimizes lens matching 10 2000
 
NEWPORT FAB, LLC DBA JAZZ SEMICONDUCTOR (1)
* 6417755 Method for fabrication of high inductance inductors and related structure 12 2000
* Cited By Examiner

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
MICRON TECHNOLOGY, INC. (8)
* 7388462 Integrated circuit inductors 20 2002
7158004 Integrated circuit inductors 11 2002
6976300 Integrated circuit inductors 4 2002
* 2002/0095,773 Integrated circuit inductors 0 2002
* 2002/0095,770 Integrated circuit inductors 1 2002
* 2002/0095,768 Integrated circuit inductors 0 2002
6948230 Integrated circuit inductors 5 2002
* 2002/0095,778 Integrated circuit inductors 3 2002
 
MENTOR GRAPHICS CORPORATION (9)
* 8161438 Determining mutual inductance between intentional inductors 6 2006
* 2006/0282,492 Determining mutual inductance between intentional inductors 13 2006
8549449 Mutual inductance extraction using dipole approximations 5 2009
8214788 High-frequency VLSI interconnect and intentional inductor impedance extraction in the presence of a multi-layer conductive substrate 0 2009
8650522 Determining mutual inductance between intentional inductors 0 2012
8732648 High-frequency VLSI interconnect and intentional inductor impedance extraction in the presence of a multi-layer conductive substrate 8 2012
8826204 Mutual inductance extraction using dipole approximations 0 2013
8910108 High-frequency VLSI interconnect and intentional inductor impedance extraction in the presence of a multi-layer conductive substrate 0 2014
9230054 High-frequency VLSI interconnect and intentional inductor impedance extraction in the presence of a multi-layer conductive substrate 0 2014
 
GLOBALFOUNDRIES INC. (5)
* 6975199 Embedded inductor and method of making 14 2001
6931712 Method of forming a dielectric substrate having a multiturn inductor 3 2004
7288417 On-chip signal transformer for ground noise isolation 2 2005
* 2006/0148,106 ON-CHIP SIGNAL TRANSFORMER FOR GROUND NOISE ISOLATION 6 2005
9548158 3D multipath inductor 0 2014
 
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (2)
* 6856003 Microelectronic 3-D solenoid of circular cross-section and method for fabrication 1 2002
* 2004/0046,232 Microelectronic 3-D solenoid of circular cross-section and method for fabrication 0 2002
 
INFINEON TECHNOLOGIES AG (1)
* 2008/0204,183 3D-COIL FOR SAVING AREA USED BY INDUCTANCES 1 2007
* Cited By Examiner