System and method for fabricating components of precise optical path length
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United States of America Patent
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Oct 1, 2002
Grant Date -
Jul 18, 2002
app pub date -
Sep 4, 2001
filing date -
Sep 5, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Optical components, particularly microoptic glass components used in synthesizing birefringence in filter systems based on polarization interferometer techniques, are fabricated using systems and methods which provide accurate frequency periodicity measurements. These measurements are derived from differential delays induced by in-process glass elements between beam components in a polarization interferometer unit and from progressive wavelength scanning across a wavelength band of interest. The consequent sinusoidal output variation has peak to peak spacings which are measured to provide frequency periodicity values from which precise length corrections for the optical elements can be calculated.
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