BUILT-IN PROGRAMMABLE SELF-DIAGNOSTIC CIRCUIT FOR SRAM UNIT
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United States of America Patent
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-
Oct 1, 2002
Grant Date -
Oct 3, 2002
app pub date -
Jul 9, 2001
filing date -
Apr 2, 2001
priority date (Note) -
Granted
status (Latency Note)
Importance
Abstract
A built-in programmable self-diagnostic circuit for finding and locating faults in a static random access memory (SRAM) unit. The circuit includes a plurality of multiplexers, a demultiplexer, a test pattern generator, a fault location indicator and a controller. The circuit uses either internal test instructions or pre-programmed test instructions to test the SRAM unit so that the exact location of any fault in the SRAM unit can be found and subsequently repaired.
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