High speed memory test system with intermediate storage buffer and method of testing
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United States of America Patent
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Oct 1, 2002
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N/A
app pub date -
Sep 11, 2000
filing date -
Mar 11, 1998
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Expired
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Abstract
Automatic test equipment for memory device testing provides continuous high-speed testing by intelligent pausing a timer when a buffer memory is full or nearly full, the timer being paused is capable of properly maintaining refresh and clock functions for semiconductor devices.
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