Method and apparatus for probing a conductor of an array of closely-spaced conductors
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United States of America Patent
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Oct 8, 2002
Grant Date -
N/A
app pub date -
May 23, 2000
filing date -
May 23, 2000
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method and apparatus for probing a terminal of a ball grid array device, or a conductor of an array of closely-spaced conductors, preferably employs a buried tip resistor located substantially adjacent to the point to be monitored. In this way, a relatively short stub is provided from the connection point to the tip resistor. A receiver amplifier arrangement substantially eliminates an offset error affecting prior art amplifier arrangements, where the offset error is introduced into the signal to be measured due to variation in the resistance value of the tip resistor. It is recognized that the invention is not limited to buried-resistor applications, but is also applicable in probing situations involving the use of tip resistors having a tolerance range greater than 1%.
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