Multi-wavelength etalon
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United States of America Patent
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Oct 8, 2002
Grant Date -
N/A
app pub date -
Nov 16, 1999
filing date -
Nov 16, 1999
priority date (Note) -
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Abstract
A multi-wavelength etalon comprises at least two regions with different indices of refraction. The change in refractive index alters the wavelengths of incident light, and thus the number of wavelengths between the reflective surfaces of the etalon, and therefore the etalon's transmission characteristics. By selecting specific indices of refraction, an etalon can be provided which produces peaks and troughs at preselected wavelengths in each region. The transition between two adjacent regions with different indices of refraction can be graded to reduce optical interference which may result from an abrupt transition.
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