Method of producing a single crystal gallium nitride substrate and single crystal gallium nitride substrate

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6468882
APP PUB NO 20020028564A1
SERIAL NO

09901119

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Abstract

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GaN single crystal substrates are produced by slicing a GaN single crystal ingot in the planes parallel to the growing direction. Penetration dislocations which have been generated in the growing direction extend mainly in the bulk of the GaN substrate. A few of the threading dislocations appear on the surface of the GaN substrate. GaN substrates of low-dislocation density are obtained.

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Patent Owner(s)

Patent OwnerAddress
SUMITOMO ELECTRIC INDUSTRIES LTDOSAKA-SHI OSAKA 541-0041

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kasai, Hitoshi Itami, JP 50 1330
Motoki, Kensaku Itami, JP 80 2623
Okahisa, Takuji Itami, JP 62 2509

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