Compact nonvolatile circuit having margin testing capability
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United States of America Patent
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Oct 22, 2002
Grant Date -
N/A
app pub date -
Oct 30, 2000
filing date -
Oct 30, 2000
priority date (Note) -
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Abstract
According to one embodiment, a nonvolatile circuit (100) can include a volatile circuit portion (102) and a nonvolatile circuit portion (104). A vole portion (102) may have a first data node (114) and a second data node (116). A nonvolatile circuit portion (104) may include a nonvolatile device (128) that is connected to a first data node (114) by a recall device (124) and connected to a second data node (116) by store device (126). A recall device (124) may be enabled to recall the volatile circuit portion (102) to a particular state. A store device (126) may be enabled to program a nonvolatile device (128). Store and recall devices (126 and 124) can enable a recall operation to follow a store operation that does not invert data at first and second data nodes (114 and 116). A control device (122) can be included that enables margin testing of a nonvolatile device (128).
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