Substrate processing apparatus and substrate processing method

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United States of America Patent

PATENT NO 6471422
SERIAL NO

10122333

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Abstract

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Thermal processing unit sections each with ten tiers and coating processing unit sections each with five tiers are disposed around a first main wafer transfer section and a second main wafer transfer section, and in the thermal processing unit section, the influence of the time required for substrate temperature regulation processing on a drop in throughput can be reduced greatly by transferring the wafer W while the temperature of the wafer W is being regulated by a temperature regulation and transfer device.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITED3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 1076325 ?1076325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Deguchi, Yoichi Tokyo-To, JP 25 851
Hayashi, Shinichi Kumamoto-Ken, JP 211 2964
Iida, Naruaki Kumamoto-Ken, JP 50 1916
Matsuyama, Yuji Kumamoto-Ken, JP 56 1243
Ueda, Issei Kumamoto-Ken, JP 52 2498

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