Substrate processing apparatus and substrate processing method

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United States of America Patent

PATENT NO 6471422
SERIAL NO

10122333

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Thermal processing unit sections each with ten tiers and coating processing unit sections each with five tiers are disposed around a first main wafer transfer section and a second main wafer transfer section, and in the thermal processing unit section, the influence of the time required for substrate temperature regulation processing on a drop in throughput can be reduced greatly by transferring the wafer W while the temperature of the wafer W is being regulated by a temperature regulation and transfer device.

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Patent Owner(s)

  • TOKYO ELECTRON LIMITED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Deguchi, Yoichi Tokyo-To, JP 25 766
Hayashi, Shinichi Kumamoto-Ken, JP 207 2764
Iida, Naruaki Kumamoto-Ken, JP 49 1718
Matsuyama, Yuji Kumamoto-Ken, JP 56 1151
Ueda, Issei Kumamoto-Ken, JP 52 2161

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