Film forming method, semiconductor device manufacturing method, and semiconductor device

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United States of America Patent

PATENT NO 6472334
APP PUB NO 20010041458A1
SERIAL NO

09824106

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Abstract

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There is provided a method of forming a silicon-containing insulating film on a substrate by reacting a compound having siloxane bonds and Si--R bonds (R is alkyl group) with a plasmanized reaction gas containing an oxidizing gas and H.sub.2.

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Patent Owner(s)

Patent OwnerAddress
CANON KABUSHIKI KAISHA30-2 SHIMOMARUKO 3-CHOME OHTA-KU TOKYO 146-8501

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ikakura, Hiroshi Tokyo, JP 20 666
Maeda, Kazuo Tokyo, JP 139 3781
Ohira, Kouichi Tokyo, JP 24 545
Shioya, Yoshimi Tokyo, JP 31 1773
Suzuki, Tomomi Tokyo, JP 93 2811

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