US Patent No: 6,473,177

Number of patents in Portfolio can not be more than 2000

Particle-size distribution measuring apparatus

ALSO PUBLISHED AS: 20020003624

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Abstract

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The present invention presents a particle-size distribution measuring apparatus which allows measuring simultaneously the dispersion state of particles in suspension medium and the particle-size distribution of the particles. The present invention is a particle-size distribution measuring apparatus which measures the particle-size distribution of particles included in a sample. The particle-size distribution measuring apparatus comprises a pH meter for measuring the pH value of the sample and an information processing portion which determines the relation between the pH value and the particle-size distribution on the basis that the pH value measured by the pH meter and the measured particle-size distribution are in the same state.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
HORIBA, LTD.KYOTO212

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yamaguchi, Tetsuji Atsugi, JP 156 559

Cited Art Landscape

Patent Info (Count) # Cites Year
 
PARTICLE MEASURING SYSTEMS, INC. (1)
* 6,275,290 Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems 17 1999
 
OTSUKA ELECTRONICS CO., LTD. (1)
* 5,015,094 Particle size measuring system 11 1989
 
KABUSHIKI KAISHA TOSHIBA (1)
* 6,354,913 Abrasive and method for polishing semiconductor substrate 14 1999
 
AGILENT TECHNOLOGIES, INC. (1)
* 6,211,956 Automatic dilution system for high-resolution particle size analysis 29 1998
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
STABLE SOLUTIONS LLC (1)
* 2012/0318,051 PARTICLE SIZE DISTRIBUTION PROFILES AND USE THEREOF TO ADJUST A DISPERSION CHARACTERISTIC 0 2010
 
HORIBA, LTD. (2)
6,864,979 Particle size distribution measuring apparatus 2 2001
6,970,243 Particle size distribution measuring apparatus 0 2002
* Cited By Examiner