US Patent No: 6,473,177

Number of patents in Portfolio can not be more than 2000

Particle-size distribution measuring apparatus

ALSO PUBLISHED AS: 20020003624

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Abstract

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The present invention presents a particle-size distribution measuring apparatus which allows measuring simultaneously the dispersion state of particles in suspension medium and the particle-size distribution of the particles. The present invention is a particle-size distribution measuring apparatus which measures the particle-size distribution of particles included in a sample. The particle-size distribution measuring apparatus comprises a pH meter for measuring the pH value of the sample and an information processing portion which determines the relation between the pH value and the particle-size distribution on the basis that the pH value measured by the pH meter and the measured particle-size distribution are in the same state.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
HORIBA, LTD.KYOTO450

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yamaguchi, Tetsuji Atsugi, JP 141 484

Cited Art Landscape

Patent Info (Count) # Cites Year
 
AGILENT TECHNOLOGIES, INC. (1)
6,211,956 Automatic dilution system for high-resolution particle size analysis 26 1998
 
KABUSHIKI KAISHA TOSHIBA (1)
6,354,913 Abrasive and method for polishing semiconductor substrate 14 1999
 
OTSUKA ELECTRONICS CO., LTD. (1)
5,015,094 Particle size measuring system 11 1989
 
PARTICLE MEASURING SYSTEMS, INC. (1)
6,275,290 Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems 17 1999

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
HORIBA, LTD. (2)
6,864,979 Particle size distribution measuring apparatus 2 2001
6,970,243 Particle size distribution measuring apparatus 0 2002

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