Sensor array for rapid materials characterization
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United States of America Patent
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Nov 5, 2002
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N/A
app pub date -
Dec 11, 1998
filing date -
Dec 11, 1998
priority date (Note) -
Expired
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Abstract
A sensor-array based materials characterization apparatus for characterizing one or more material properties of at least five test samples, wherein the apparatus includes a sensor array disposed on a substrate; electronic test circuitry for sending electrical signals to and receiving electrical signals from the sensor array; electronic circuitry for routing signals between selected sensors and the electronic test circuitry; and a computer or processor electrically coupled to electronic test circuitry and electronic circuitry.
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