Method for temporary suppression of reflection for optical measurement

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United States of America Patent

PATENT NO 6480268
SERIAL NO

09503226

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A process for measuring at least one parameter of an optical element having first and second surfaces on opposed sides thereof uses a reflection-reducing member, which is solid and has substantial mechanical integrity, but which is resilient and elastically deformable so as to conform to a surface with which it is placed in contact. This reflection-reducing member is contacted with the second surface of the optical element so that a surface of the reflection-reducing member conforms to this second surface, the parameter is measured, and the reflection-reducing member is removed from the second surface leaving this surface substantially free from any residue. The presence of the reflection-reducing member reduces or eliminates unwanted reflections from the second or 'back' surface of the optical element, thus simplifying the measurement of any parameter which depends upon detecting reflection from the first or 'front' surface of the optical element.

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Patent Owner(s)

Patent OwnerAddress
OPTIKOS CORPORATION107 AUDUBON ROAD WAKEFIELD MA 01880

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wilk, Stephen R Saugus, MA 6 102

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