Printed circuit board testing apparatus and probe device for use in the same
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 26, 2002
Grant Date -
N/A
app pub date -
May 26, 2000
filing date -
May 26, 1999
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe device is mounted on a circuit provided with a holder mountable to a circuit board testing apparatus, a contact needle attachable to the holder. The contact needle is operable to resiliently bend in a specified direction immediately after coming into contact with a circuit board. The bending absorbs a contact impact to ensure accurate measurement.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully