Semiconductor device simulating apparatus and semiconductor test program debugging apparatus using it
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United States of America Patent
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Nov 26, 2002
Grant Date -
N/A
app pub date -
Mar 8, 2000
filing date -
Mar 15, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Herein disclosed is a semiconductor device simulation apparatus which is set the various parameters to be used for measuring a current value and a voltage value that varies depending on the internal resistance of a DUT, and simulates a current value or a voltage value that varies depending on an internal resistance of a DUT in accordance with various parameters and a prescribed test signal when receiving the test signal. Also disclosed is a semiconductor test program debugging apparatus using such a semiconductor device simulating apparatus.
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