Methods for finding peaks in a characteristic surface of an image
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United States of America Patent
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Dec 3, 2002
Issued Date -
N/A
app pub date -
May 21, 2001
filing date -
Jul 23, 1998
priority date (Note) -
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Abstract
An efficient and reliable method that identifies possible reference sites in an image is disclosed. The method emphasizes customizing the identification of reference sites for each application by providing for initialization of various parameters, such as the size of the reference site. The method then uses a series of measurable parameters to filter possible reference sites in the image and produces and ordered set of possible reference sites. The highest-ranking site of the ordered set is expected to be chosen as the reference site for production. A preferred implementation is disclosed that uses multi-resolution images to enhance efficiency of the identification and that specifically measures the symmetry, orthogonality and uniqueness of the windows.
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