Method and apparatus for exercising external memory with a memory built-in self-test
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United States of America Patent
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Dec 10, 2002
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N/A
app pub date -
Mar 2, 2000
filing date -
Dec 29, 1999
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Abstract
A method and arrangement for performing a memory built-in self test (MBIST) of an external memory and an internal memory of a network interface controller includes a series of burst write and burst read operations if an external memory is detected. The sequence of burst operations tests the back-to-back burst write, back-to-back burst write burst read, back-to-back burst read and back-to-back burst read burst write capabilities of the external memory, to thereby fully exercise the external memory. Additionally, the internal memory is tested by single write and single read accesses.
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