Endoscope inspection system
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United States of America Patent
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Dec 24, 2002
Grant Date -
N/A
app pub date -
May 3, 2000
filing date -
May 3, 2000
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An inspection system for performing a test selected from the group consisting of field of view, angle of view, distortion, image quality, depth of field, illumination system transmission efficiency, illumination profile, relative transmission of imaging system and centering error of a rigid, rod lens endoscope. The inspection system includes a testing station supporting a plurality of targets for measuring an optical performance of the endoscope, and a controller controllably displacing the testing station linearly toward and away from the endoscope and rotating the testing station at a nominal angle of view of the endoscope about a first axis and rotating the targets about a second axis parallel to the first axis to selectively displace each of the targets into the field of view of the endoscope.
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Cited Art Landscape
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