Defect diagnosis method and defect diagnosis apparatus
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Dec 24, 2002
Grant Date -
N/A
app pub date -
Apr 13, 1999
filing date -
Dec 4, 1998
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method for diagnosis of a defect of an object to be inspected, such as a rotational machine, etc., by measuring a vibration generated thereby, wherein a measured signal generated by the object is detected, an amplitude probability density function of wave-form of the obtained measured signal is expanded orthogonally through a Gram-Charlier series, and the Gram-Charlier series are calculated so as to make diagnosis of defect(s) in the object to be inspected.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully