Imaging array minimizing leakage currents
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United States of America Patent
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-
Jan 7, 2003
Grant Date -
Jun 6, 2002
app pub date -
Dec 4, 2000
filing date -
Dec 4, 2000
priority date (Note) -
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status (Latency Note)
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Abstract
An imaging array of photodiodes on a chip cut from a semiconductor wafer includes a guard diode at each cut edge to reduce leakage current from the cut edges when the imaging array is in use. The photodiodes and guard diode may be fabricated from the same materials during the same process step. Electrical contacts coupled to the imaging array provide a mechanism for applying a reverse electrical bias to the photodiodes and guard region with respect to the wafer.
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