Integrated circuit tester

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6505312
SERIAL NO

09510362

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Pins of an integrated circuit are provided with timing axis signals for testing in the time axis without discrepancies. An electro-optic probe in proximity to a plurality of contact points of a device under test uses positions of equal distance or a pre-set distance as skew measurement points, and detects timing axis signals on each microstrip line, A phase detector detects the phase of the timing axis signals that the electro-optic probe detects, and a phase difference calculator finds the phase difference between the phase detected by the phase detector and a reference value. Phase control of the timing axis signals is carried out by a phase controller so as to cancel the obtained phase difference.

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Patent Owner(s)

  • ANDO ELECTRIC CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sugizaki, Takayuki Tokyo, JP 2 4
Takeuchi, Nobuaki Tokyo, JP 23 159
Terayama, Chitomi Tokyo, JP 2 7
Yanagisawa, Yoshiki Tokyo, JP 16 44

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