Tester accuracy using multiple passes
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United States of America Patent
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-
Jan 14, 2003
Grant Date -
N/A
app pub date -
May 8, 2001
filing date -
May 8, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A test circuit generally comprising a tester connected to a socket for holding a device under test. The device may be configured to have (i) a first function and (ii) a final function. The tester may be configured to (i) stimulate the first function with a test signal to present a first output signal, (ii) stimulate the final function with the first output signal to present a final output signal; (iii) measure a result between the test signal and the final output signal, and (iv) allocate the result between the first function and the final function to disperse a measurement error in the result.
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