System and method for storing, retrieving, and analyzing characterization data

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United States of America Patent

PATENT NO 6513043
SERIAL NO

09653932

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Abstract

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A technique for efficiently structuring a database takes advantage of redundancy in data point conditions to reduce the time associated with the insertion of data points into a database and to reduce the amount of required storage space. The technique is particularly suited for semiconductor characterization data having a large number of test data points collected under repeated test conditions. The data point conditions are analyzed to inventory the different unique conditions associated with the given set of data points. Each unique combination of conditions is assigned a variable array, and each variable array element identifies a specific condition. The data point values are linked to variable set handles that represent the different variable arrays. In this manner, the data points can be inserted into the database without having to store each data point value with all of the corresponding conditions. Rather, the data point values are stored along with their respective variable set handles. The present invention also provides techniques for data extraction, management, and analysis, along with a database management system configured to carry out the various techniques.

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Patent Owner(s)

Patent OwnerAddress
VENCORE SOLUTIONS LLC4500 SW KRUSE WAY STE 350 LAKE OSWEGO OR 97035

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chan, Mark Che-hung San Diego, CA 1 21
Griffith, Steven William San Diego, CA 1 21
Jelden, Alan Ward Vista, CA 1 21

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