Spiral contactor, semiconductor device inspecting apparatus and electronic part using same, and method of manufacturing the same

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6517362
APP PUB NO 20020037657A1
SERIAL NO

09925797

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Abstract

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A spiral contactor for establishing an electric connection with a semiconductor device or an electronic part including a solder ball includes a spiral probe having a spiral shape as viewed from a top thereof. The spiral probe is embedded in an insulating substrate in a manner that permits resilient deformation thereof in accordance with a shape of the solder ball, and an edge of the spiral probe is pressed to engage into the solder ball and slides along a periphery of the solder ball, thereby cutting oxide membrane thereon. The spiral contactor may be manufactured by combination of the photolithography technique and the plating process, and used for a semiconductor inspecting apparatus and an electronic part.

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Patent Owner(s)

Patent OwnerAddress
ADVANCED SYSTEMS JAPAN INCTOKYO JAPAN TOKYO METROPOLIS

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hirai, Yukihiro c/o Advanced Systems Japan, 1-7-21 Maebaracho, Koganei-shi, Tokyo 184-0013, JP 7 198
Ueda, Chihiro Tokyo, JP 6 572
Yoshida, Kouichi Tokyo, JP 17 271

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