Method of producing a micromechanical structure for a micro-electromechanical element

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United States of America Patent

PATENT NO 6518084
SERIAL NO

09868402

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Abstract

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In a method of producing a micromechanical structure for a micro-electromechanical element, a first intermediate layer, which is applied to a first main surface of a first semiconductor wafer, is structured in a first step so as to produce a recess. The first semiconductor wafer is then connected via the first intermediate layer to a second semiconductor wafer in such a way that a hermetically sealed cavity is defined by the recess. Finally, one of the wafers is thinned from a surface facing away from said first intermediate layer so as to produce a diaphragm-like structure on top of the cavity. At least one further intermediate layer is provided between the two semiconductor wavers which, prior to the connection of the two semiconductor wafers, is structured in such a way that the structure formed in said at least one further intermediate layer and the recess in said first intermediate layer define the cavity.

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Patent Owner(s)

Patent OwnerAddress
IP VERWERTUNGS GMBHTOELZER STR 5 82031 GRUENWALD

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bollmann, Dieter Munich, DE 9 118
Hoefter, Leonhard Munich, DE 1 16
Kruckow, Juergen Munich, DE 7 86
Neumeier, Karl Unterhaching, DE 8 62
Seitz, Stefan Planegg, DE 25 629

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