Semiconductor integrated circuit having test circuit
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United States of America Patent
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Feb 11, 2003
Grant Date -
Dec 19, 2002
app pub date -
May 3, 1999
filing date -
Nov 25, 1998
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A semiconductor integrated circuit has a test circuit in which signal pad (15) to input a switching signal TM is formed on a non-mounting surface of a LSI and one group of signal pads (11 to 13) formed on the non-mounting surface and signal pads (16 to 18) formed on a mounting surface is selected based on a signal level of the switching signal TM.
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