Magneto-optical microscope magnetometer

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United States of America Patent

PATENT NO 6528993
SERIAL NO

09717611

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Abstract

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A magneto-optical microscope magnetometer capable of simultaneously measuring a hysteresis loop and activation magnetic moment of a submicrometer-scale local area (about 0.3.times.0.3 .mu.m). An electromagnet capable of applying a magnetic field to a magnetic material is attached to a polarizing optical microscope capable of observing a magnetized state of the magnetic material, such that images of the microscope varying with the strength of the applied magnetic field are grabbed in real time by a charge coupled device camera and then analyzed. The magneto-optical microscope magnetometer can measure a hysteresis loop and activation magnetic moment in a submicrometer-scale local area observed by the polarizing optical microscope. Further, the magneto-optical microscope magnetometer can measure hysteresis loops and activation magnetic moments simultaneously with respect to all CCD pixels of the camera and observe coercivity and activation magnetic moment distributions of the entire magnetic material.

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Patent Owner(s)

Patent OwnerAddress
KOREA ADVANCED INSTITUTE OF SCIENCE & TECHNOLOGY373-1 GUSEONG-DONG YUSEONG-GU DAEJEON 305-701 SOUTH

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Choe, Sug Bong Taejon-si, KR 3 98
Shin, Sung Chul Taejon-si, KR 33 278

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