System and method for performing lithography on a substrate

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United States of America Patent

PATENT NO 6529262
SERIAL NO

09547743

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Disclosed is a method, system, and lense system for performing lithography on a substrate. The system includes a unique lense system for nonplanar substrates. The lense system includes a first lense section for receiving a pattern and producing a concave image of the pattern. The concave image can the be received by a second lense section for producing a nonplanar image of the pattern. The system also includes two light sources and a digital imaging device for projecting and exposing the pattern through the lense section and onto the substrate. Light from the first light source is used for exposing the pattern while light from second light source is used for receiving an alignment image. An image sensor, using the light from the second light source, detects an alignment image from the substrate. The alignment image is used to accommodate the projection of the pattern onto the substrate so that the pattern is properly aligned to the substrate.

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Patent Owner(s)

Patent OwnerAddress
DISCO CORPORATIONTOKYO

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kanatake, Takashi Dallas, TX 25 419
Mei, Wenhui Plano, TX 31 1001

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