Built-in programmable self-diagnostic circuit for SRAM unit
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United States of America Patent
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Mar 4, 2003
Issued Date -
N/A
app pub date -
Jun 4, 2002
filing date -
Apr 2, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A built-in programmable self-diagnostic circuit for finding and locating faults in a static random access memory (SRAM) unit. The circuit includes a plurality of multiplexers, a demultiplexer, a test pattern generator, a fault location indicator and a controller. The circuit uses either internal test instructions or pre-programmed test instructions to test the SRAM unit so that the exact location of any fault in the SRAM unit can be found and subsequently repaired.
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