Machine vision method for the inspection of a material for defects
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United States of America Patent
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Mar 11, 2003
Issued Date -
N/A
app pub date -
Apr 27, 2001
filing date -
Dec 29, 2000
priority date (Note) -
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Abstract
A machine vision method and system for inspecting a material. The system comprises a light source arranged to illuminate the material and an imaging device configured to acquire image data corresponding to at least one characteristic of the material while the material is being illuminated by the light source. An image processor is configured to normalize the image data and to control adjustment of an exposure control level for the imaging device based upon the normalized image data. An exemplary method of implementing the machine vision system may include illuminating a material using a light source and obtaining image data corresponding to the material using an imaging device. The image data may be normalized and the adjustment of an exposure control level of the imaging device may be controlled based on the normalized image data.
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