Method for testing a controller with random constraints

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United States of America Patent

PATENT NO 6535841
SERIAL NO

09383169

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Abstract

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A method for testing an IDE controller with random constraints, the method comprising: providing an IDE controller model having a primary and a secondary channel and a host interface; transmitting data patterns to a primary and a secondary device model; receiving the data patterns from the primary and secondary device models; arbitrating the transfer of the data patterns to and from the primary and secondary device models; and determining whether the data patterns returned from the primary and secondary device models match expected values.

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Patent Owner(s)

Patent OwnerAddress
MICRON TECHNOLOGY INC8000 SOUTH FEDERAL WAY BOISE ID 83716-9632

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Meyer, James W Shoreview, MN 36 681

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