Method and apparatus for modeling specular reflection

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United States of America Patent

PATENT NO 6545677
SERIAL NO

09845781

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Abstract

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A method and apparatus for modeling the specular reflection of light from an object is disclosed. In accordance with one embodiment of the method, a portion of the object is modeled by one or more surfaces each having at least one vertex and an edge point corresponding to an edge. A sine value associated with a highlight angle is determined at each vertex and edge point, and a control value is determined at each vertex and edge point using the sine values. A specular input component at each point on the surface is determined using the control values. The specular input component is utilized to determine the specular light component at that particular point. Embodiments of apparatus implementing the method are also disclosed.

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Patent Owner(s)

Patent OwnerAddress
SUN MICROSYSTEMS INC4150 NETWORK CIRCLE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Brown, Russell A Palo Alto, CA 16 995

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