Process for continuous determination of the optical layer thickness of coatings

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United States of America Patent

PATENT NO 6549291
SERIAL NO

09655222

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii R.sub.1 and R.sub.2. In this process a ray of light is beamed eccentrically during the coating process at each concave convex lens, and the reflection or transmission at the convex spherical surface and at the concave spherical surface is continuously measured with photodiodes, and the respective optical layer thickness is determined from the functional relationship between the reflection or the transmission and the optical layer thickness.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
BALZERS LEYBOLD OPTICS GMBHD-63450 HANAU0

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beckman, Rudolf Hanau, DE 1 12
Dieter, Torsten Bad Soden/Salmunster, DE 1 12
Hagedorn, Harro Frankfurt, DE 8 27
Zoller, Alfons Bad Soden/Salmunster, DE 8 83

Cited Art Landscape

Patent Info (Count) # Cites Year
 
WELLS FARGO BANK, NATIONAL ASSOCIATION (1)
* 6128087 System for evaluating thin film coatings 5 1998
 
TRU VUE, INC. (1)
* 5772861 System for evaluating thin film coatings 16 1995
 
Measurex Corporation (1)
* 5355083 Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate 70 1989
 
TELEFONAKTIEBOLAGET L M ERICSSON (PUBL) (1)
* 6055058 Method and device for determining the thickness and concentricity of a layer applied to a cylindrical body 5 1997
 
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. (1)
* 5564830 Method and arrangement for determining the layer-thickness and the substrate temperature during coating 58 1994
 
Wagner International AG (1)
* 5841138 Method of an apparatus for nondestructuve workpiece testing 3 1996
 
SUMITOMO ELECTRIC INDUSTRIES, LTD. (2)
* 5208645 Method and apparatus for optically measuring the thickness of a coating 15 1991
* 5289265 Method and apparatus for measuring a coating state 26 1992
 
Saint-Gobain Cinematique et Controle (1)
* 5657124 Method of measuring the thickness of a transparent material 13 1995
 
OPTIKOS CORPORATION (1)
5416574 Automated optical measurement apparatus 9 1992
 
Infrared Engineering Limited (1)
4320967 Apparatus for measuring a radiation affecting parameter of a film or coating 12 1980
 
RAYTHEON COMPANY (1)
5289266 Noncontact, on-line determination of phosphate layer thickness and composition of a phosphate coated surface 19 1992
 
DAEWOO ELECTRONICS CO., LTD. (1)
* 5696583 Apparatus for automatically measuring the thickness of a transparent coating material using a white light source 7 1995
 
Canon Kabushiki Kaisha (1)
* 5282217 Light source driving apparatus and system utilizing the same 7 1991
 
Leybold Aktiengesellschaft (1)
4832490 Photometer 10 1987
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (1)
* 2003/0115,214 Medical reporting system and method 2 2001
 
DIMENSION BOND CORPORATION (13)
* 6998147 Method for simultaneously coating and measuring parts 4 2002
6997992 Apparatus for simultaneously coating and measuring parts 2 2004
6991683 Apparatus for simultaneously coating and measuring parts 0 2004
7455878 Method for simultaneously coating and measuring parts 0 2004
7294206 Apparatus and method for simultaneously coating and measuring parts 0 2004
* 2005/0098,104 Apparatus and method for simultaneously coating and measuring parts 0 2004
7537796 Method for simultaneously coating and measuring parts 0 2005
7537797 Method for simultaneously coating and measuring parts 1 2005
* 2006/0073,267 Method for simultaneously coating and measuring parts 0 2005
7396414 Apparatus for simultaneously coating and measuring parts 0 2005
* 2006/0090,698 Apparatus for simultaneously coating and measuring parts 0 2005
7645477 Method for simultaneously coating and measuring parts using at least one digital camera 0 2008
* 2009/0041,927 APPARATUS AND METHOD FOR SIMULTANEOUSLY COATING AND MEASURING PARTS 0 2008
 
DOVER PHOTONICS LLC (1)
* 6731380 Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films 10 2001
 
APPLIED MATERIALS GMBH & CO. KG (2)
* 7450233 Measuring device for the measurement of optical properties of coated substrates 0 2004
* 2006/0192,964 Measuring device for the measurement of optical properties of coated substrates 4 2004
 
LUXOTTICA US HOLDINGS CORPORATION (2)
* 2011/0229,659 ION BEAM ASSISTED DEPOSITION OF OPHTHALMIC LENS COATINGS 7 2011
* 2011/0229,660 ION BEAM ASSISTED DEPOSITION OF OPHTHALMIC LENS COATINGS 8 2011
 
BG RADIA CORPORATION (1)
* 2009/0214,760 Optical Monitoring System for Coating Processes 1 2006
 
UNITED TECHNOLOGIES CORPORATION (1)
7573586 Method and system for measuring a coating thickness 5 2008
* Cited By Examiner