US Patent No: 6,549,291
Number of patents in Portfolio can not be more than 2000
Process for continuous determination of the optical layer thickness of coatings
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Apr 15, 2003
Issued date -
Sep 5, 2000
filing date -
09/655,222
serial no -
In Force
status
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Abstract
Process for continuous determination of the optical layer thickness of coatings, which are applied on both sides of the spherical surfaces of concave convex lenses having different spherical radii R.sub.1 and R.sub.2. In this process a ray of light is beamed eccentrically during the coating process at each concave convex lens, and the reflection or transmission at the convex spherical surface and at the concave spherical surface is continuously measured with photodiodes, and the respective optical layer thickness is determined from the functional relationship between the reflection or the transmission and the optical layer thickness.
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First Claim
Related Publications
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International Classification(s)
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Cited Art
| Patent Info | (Count) | # Cites | Year |
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| 5,208,645 Method and apparatus for optically measuring the thickness of a coating | 11 | 1991 | |
| 5,289,265 Method and apparatus for measuring a coating state | 10 | 1992 | |
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| 5,282,217 Light source driving apparatus and system utilizing the same | 7 | 1991 | |
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| 5,696,583 Apparatus for automatically measuring the thickness of a transparent coating material using a white light source | 6 | 1995 | |
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| 5,564,830 Method and arrangement for determining the layer-thickness and the substrate temperature during coating | 56 | 1994 | |
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| 4,320,967 Apparatus for measuring a radiation affecting parameter of a film or coating | 12 | 1980 | |
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| 4,832,490 Photometer | 7 | 1987 | |
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| 5,355,083 Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate | 66 | 1989 | |
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| 5,416,574 Automated optical measurement apparatus | 9 | 1992 | |
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| 5,289,266 Noncontact, on-line determination of phosphate layer thickness and composition of a phosphate coated surface | 19 | 1992 | |
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| 5,657,124 Method of measuring the thickness of a transparent material | 12 | 1995 | |
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| 6,055,058 Method and device for determining the thickness and concentricity of a layer applied to a cylindrical body | 5 | 1997 | |
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| 5,772,861 System for evaluating thin film coatings | 15 | 1995 | |
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| 5,841,138 Method of an apparatus for nondestructuve workpiece testing | 2 | 1996 | |
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| 6,128,087 System for evaluating thin film coatings | 3 | 1998 | |
Patent Citation Ranking
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
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| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Oct 15, 2014 |
| Fee | Large entity fee | small entity fee | micro entity fee |
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| Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
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