Method for conducting sensor array-based rapid materials characterization

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United States of America Patent

PATENT NO 6553318
APP PUB NO 20020028456A1
SERIAL NO

09858048

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Abstract

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There is disclosed a material characterization method. The method may include any combination of several potential steps. According to one of the steps multiple material samples are applied to multiple sensors in an array of sensors. In another step, one or more of the sensors of the array are electrically contacted. In another step, electrical connections are formed between selected sensors and electronic test and measurement apparatus. In another step, electric signals are sent to and received from the sensors in the array wherein the signals correspond to thermal, electrical, mechanical or other properties of the material samples. Preferably, some of the equipment (e.g., the electrical connections) used in the method are standardized to allow equipment such as sensor arrays to be interchangeable with equipment such as the electronic test and measurement apparatus.

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Patent Owner(s)

Patent OwnerAddress
FREESLATE INC415 OAKMEAD PARKWAY SUNNYVALE CA 94085

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mansky, Paul San Francisco, CA 76 1814

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