Method of manufacturing probe unit and probe unit manufactured using this method
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 20, 2003
Issued Date -
N/A
app pub date -
Mar 6, 2002
filing date -
Jan 17, 1998
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method for producing a probe unit for contacting an electronic circuit such as a wafer or a die having a predetermined pattern of contact pads deployed in a common plane. The method employes a base plate of made of a material capable of surface uplift when irradiated. On the surface of the base plate locations corresponding to said contact pads are determined. Further, the base plate is irradiated at the determined locations by means of a laser. This results in forming conical surface uplifts. The method further includes plating the conical surface uplifts with an electrically conductive material and providing means for electical connection between said plated conical surface uplifts and an external device.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully