Combinatorial material analysis using X-ray capillary optics
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United States of America Patent
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Jun 10, 2003
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N/A
app pub date -
Apr 2, 2001
filing date -
Apr 2, 2001
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Abstract
Method and system for analyzing local composition and structure of a compound having one or more non-zero gradients in concentration for one or more selected constituents in a selected direction. A beam of X rays having representative energy E is received by a mono-capillary or poly-capillary device and is directed at a selected small region of the compound. A portion of the X rays is diffracted at the selected region by one or more constituents of the compound, at each of two or more diffraction angles relative to a selected surface or lattice plane(s) of the compound; and the diffracted portion of X rays for each of these diffraction angles is received and analyzed at an X-ray detector. A portion of the X rays excites fluorescence radiation that is received by a fluorescence detector to estimate the relative concentrations in a compound having two or more constituents. Fluorescence X rays and diffraction X rays can be detected at each desired translational position and rotation for a target site. As a result, a concentration map for various constituents in the compound can be prepared, together with a phase map illustrating the structure of a combinatorial compound. An X-ray detector monochromator can be removed and a capillary diameter can be reduced in some situations.
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