US Patent No: 6,593,636

Number of patents in Portfolio can not be more than 2000

High speed silicon photodiodes and method of manufacture

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Abstract

A high-speed silicon photodiode and method of manufacture include a first layer of silicon having thickness in a range of about 125 .mu.m to about 550 .mu.m. A second layer of silicon has a thickness in a range of about 3 .mu.m to about 16 .mu.m and a resistivity of at least about 500 ohm-cm. This first layer is doped with a second type of impurity. In an alternative aspect, a high-speed silicon photodiode and method of manufacture includes a silicon wafer doped with a first type of impurity. On a first side of the wafer a doping of a second type is applied in an active area of a photodiode. On the reverse of the wafer a volume of silicon is etched away and the resulting trench is coated with a conductor. The wafer may also exhibit a high resistivity of at least about 500 ohm-cm. In each aspect, a reverse bias not exceeding about 3.3 volts permits operation with a frequency response of at least 750 MHz.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
OSI OPTOELECTRONICS, INC.HAWTHORNE, CA29

International Classification(s)

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  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bui, Peter Steven Westminster, CA 51 274
Taneja, Narayan Dass Long Beach, CA 52 287

Cited Art

Patent Info (Count) # Cites Year
 
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC (2)
5,252,851 Semiconductor integrated circuit with photo diode 21 1992
5,418,396 Optical semiconductor device and fabrication method therefor 15 1993
 
BELL TELEPHONE LABORATORIES, INCORPORATED (1)
4,616,247 P-I-N and avalanche photodiodes 16 1983
 
MITSUBISHI DENKI KABUSHIKI KAISHA (1)
5,040,039 Semiconductor photodetector device 34 1990
 
SILICON LABORATORIES INC. (1)
6,027,956 Process for producing planar dielectrically isolated high speed pin photodiode 37 1998
 
SUMITOMO ELECTRIC INDUSTRIES, LTD. (1)
5,315,148 Photo-sensing device 3 1993
 
U.S. PHILIPS CORPORATION (1)
4,857,980 Radiation-sensitive semiconductor device with active screening diode 13 1988

Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
OSI OPTOELECTRONICS, INC. (9)
7,880,258 Thin wafer detectors with improved radiation damage and crosstalk characteristics 1 2005
7,576,369 Deep diffused thin photodiodes 8 2005
7,579,666 Front illuminated back side contact thin wafer detectors 3 2006
7,655,999 High density photodiodes 4 2006
8,164,151 Thin active layer fishbone photodiode and method of manufacturing the same 0 2007
7,968,964 High density photodiodes 1 2009
8,324,670 Edge illuminated photodiodes 0 2010
8,399,909 Tetra-lateral position sensing detector 0 2010
8,338,905 Photodiode and photodiode array with improved performance characteristics 0 2011
 
UDT SENSORS, INC. (9)
8,120,023 Low crosstalk, front-side illuminated, back-side contact photodiode array 0 2006
7,656,001 Front-side illuminated, back-side contact double-sided PN-junction photodiode arrays 1 2006
7,728,367 Edge illuminated photodiodes 0 2007
7,709,921 Photodiode and photodiode array with improved performance characteristics 2 2008
7,898,055 Photodiode with controlled current leakage 0 2008
8,049,294 Front side illuminated, back-side contact double-sided PN-junction photodiode arrays 2 2009
8,035,183 Photodiodes with PN junction on both front and back sides 0 2010
7,948,049 Photodiode and photodiode array with improved performance characteristics 1 2010
8,278,729 Front-side illuminated, back-side contact double-sided PN-junction photodiode arrays 0 2011
 
ASML NETHERLANDS B.V. (3)
8,138,485 Radiation detector, method of manufacturing a radiation detector, and lithographic apparatus comprising a radiation detector 2 2008
8,426,831 Radiation detector, method of manufacturing a radiation detector, and lithographic apparatus comprising a radiation detector 0 2012
8,324,598 Radiation detector, method of manufacturing a radiation detector, and lithographic apparatus comprising a radiation detector 0 2012
 
PRUEFTECHNIK DIETER BUSCH AG (2)
7,723,668 Photodetector arrangement, measurement arrangement with a photodetector arrangement and process for operating a measurement arrangement 0 2007
7,705,285 Photodetector arrangement having a semiconductor body with plural layers and transistors, measurement arrangement with a photodetector arrangement and process for operating a measurement arrangement 2 2007
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (1)
7,935,546 Method and apparatus for measurement and control of photomask to substrate alignment 0 2008
 
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (1)
8,436,443 Backside depletion for backside illuminated image sensors 0 2008

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