Resistive element diagnostics for process devices
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United States of America Patent
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Jul 15, 2003
Issued Date -
N/A
app pub date -
Sep 30, 1999
filing date -
Oct 19, 1998
priority date (Note) -
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Abstract
Diagnostic circuitry of a process device is used to detect degradation of a resistive element of the process device while the process device remains online and without an additional power source. The diagnostic circuitry includes a testing circuit and a processing system. The testing circuit is coupled to the resistive element and is configured to apply a test signal to the resistive element. The test signal heats the resistive element and causes the resistive element to generate a response signal. The processing system compares a time constant of the response signal to a corresponding reference to detect degradation of the resistive element.
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